BS EN 60749-27-2006 半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.机器模型(MM)
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Electrostaticdischarge(ESD)sensitivitytesting-Machinemodel(MM)
【原文标准名称】:半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.机器模型(MM)
【标准号】:BSEN60749-27-2006
【标准状态】:现行
【国别】:英国
【发布日期】:2006-09-29
【实施或试行日期】:2006-09-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;分类;分类系统;气候;气候试验;元部件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备和元件;静电的;静电放电;静电学;环境;环境测试;环境试验;易燃性;热学;脉冲荷载能力;集成电路;机器;测量设备;机械测试;模型;潮气;耐力;半导体器件;半导体;灵敏度;模拟;温度;测试;测试装置;外观检查(测试)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Classification;Classificationsystems;Climate;Climatictests;Components;Definition;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Flammability;Heat;Impulseloadability;Integratedcircuits;Machines;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Sensitivity;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedmachinemodel(MM)electrostaticdischarge(ESD).ItmaybeusedasanalternativetestmethodtothehumanbodymodelESDtestmethod.Theobjectiveistoprovidereliable,repeatableESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,thehumanbodymodel(HBM–seeIEC60749-26)orothertestmethodsintheIEC60749series.TheMMandHBMtestmethodsproducesimilarbutnotidenticalresults.Unlessotherwisespecified,theHBMtestmethodistheoneselected.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:16P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.机器模型(MM)
【标准号】:BSEN60749-27-2006
【标准状态】:现行
【国别】:英国
【发布日期】:2006-09-29
【实施或试行日期】:2006-09-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;分类;分类系统;气候;气候试验;元部件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备和元件;静电的;静电放电;静电学;环境;环境测试;环境试验;易燃性;热学;脉冲荷载能力;集成电路;机器;测量设备;机械测试;模型;潮气;耐力;半导体器件;半导体;灵敏度;模拟;温度;测试;测试装置;外观检查(测试)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Classification;Classificationsystems;Climate;Climatictests;Components;Definition;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Flammability;Heat;Impulseloadability;Integratedcircuits;Machines;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Sensitivity;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedmachinemodel(MM)electrostaticdischarge(ESD).ItmaybeusedasanalternativetestmethodtothehumanbodymodelESDtestmethod.Theobjectiveistoprovidereliable,repeatableESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,thehumanbodymodel(HBM–seeIEC60749-26)orothertestmethodsintheIEC60749series.TheMMandHBMtestmethodsproducesimilarbutnotidenticalresults.Unlessotherwisespecified,theHBMtestmethodistheoneselected.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:16P.;A4
【正文语种】:英语
下载地址: 点击此处下载